The Determination of Metals in Chlorinated Hydrocarbons by Flame Atomic Absorption
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS
Applications
| 2021 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Rapid Analysis of Radium-226 in Water Samples by ICP-QQQ
Applications
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Quick and Easy Characterization of Microplastics in Surface Water and Treated Effluent
Applications
| 2021 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Environmental
FTIR transmission measurement of volatile liquids using the Cary 630 FTIR equipped with DialPath technology
Applications
| 2011 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Determination of percent polyethylene in polyethylene/polypropylene blends using cast film FTIR techniques
Applications
| 2012 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
WCPS: ADVANCING PEFORMANCE OF AN AXIALLY VIEWED INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETER FOR SAMPLES HIGH SOLIDS BY INNOVATIVE TORCH DESIGN
Posters
| 2011 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films