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ENHANCED HELIUM MODE CELL PERFORMANCE FOR IMPROVED INTERFERENCE REMOVAL IN ICP-MS
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| 2015 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Direct Analysis of Trace Metallic Impurities in High Purity Hydrochloric Acid by 7700s/7900 ICP-MS
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| 2017 | Agilent Technologies
ICP/MS
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Energy & Chemicals
PLASMA ROBUSTNESS IN ICP-MS BENEFITS OF A LOW CeO/Ce RATIO
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| 2015 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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WCPS: Enhancing Helium Mode Performance to Provide Improved Detection Limits for Difficult Elements Including S, P, Fe, and Se
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| 2011 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
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Agilent Technologies
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Food & Agriculture
Advancing Research of Lithium-Ion Batteries Using the Agilent Cary 630 FTIR Spectrometer
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| 2023 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Materials Testing
Plasma Robustness and Matrix Tolerance
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| 2020 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples
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| 2010 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Semiconductor Analysis
Aluminium Speciation in Natural Waters
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| 2010 | Agilent Technologies
AAS
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Agilent Technologies
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Environmental
Technical Overview and Performance Capability of the Agilent 7900s ICP-MS for Semiconductor Applications
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| 2020 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Semiconductor Analysis
Direct Determination of the Concentration of Nitric Acid Using Spatially Offset Raman Spectroscopy
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| 2023 | Agilent Technologies
RAMAN Spectroscopy
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RAMAN Spectroscopy
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Agilent Technologies
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