Library | LabRulez ICPMS

Leveraging Cl-H Mass Defect Plots for the Identification of Halogenated Organic Contaminants

Posters

| 2016 | LECO

GC/MSD, GC/HRMS, GC/TOF

Instrumentation

GC/MSD, GC/HRMS, GC/TOF

Manufacturer

Agilent Technologies, LECO

Industries

Environmental

Post-Target Analysis of Halogenated Flame Retardants Using Mass Defect Plots

Posters

| 2014 | LECO

GC/MSD, GC/HRMS, GC/TOF

Instrumentation

GC/MSD, GC/HRMS, GC/TOF

Manufacturer

Agilent Technologies, LECO

Industries

Environmental

GC-APCI IMS of Diesel

Applications

| 2015 | Agilent Technologies

GC/MSD, GC/MS/MS, GC/HRMS, GC/TOF, GC/API/MS, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS

Instrumentation

GC/MSD, GC/MS/MS, GC/HRMS, GC/TOF, GC/API/MS, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Accurate Mass Analysis of Naphthenic Acids by Argon NCI

Posters

| 2016 | Agilent Technologies

GC/MSD, GC/MS/MS, GC/HRMS, GC/Q-TOF

Instrumentation

GC/MSD, GC/MS/MS, GC/HRMS, GC/Q-TOF

Manufacturer

Agilent Technologies

Industries

Environmental

Identifying Disinfection Byproducts in Treated Water

Applications

| 2015 | LECO

GC/MSD, GC/HRMS, GC/TOF

Instrumentation

GC/MSD, GC/HRMS, GC/TOF

Manufacturer

Agilent Technologies, LECO

Industries

Environmental

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

7200 Series Q-TOF for GC/MS - A new analytical tool for solving complex analytical problems

Presentations

| 2011 | Agilent Technologies

GC/MSD, GC/MS/MS, GC/HRMS, GC/Q-TOF

Instrumentation

GC/MSD, GC/MS/MS, GC/HRMS, GC/Q-TOF

Manufacturer

Agilent Technologies

Industries

Agilent Cary 610/620 FTIR microscopes and imaging systems

Brochures and specifications

| 2014 | Agilent Technologies

FTIR Spectroscopy, Microscopy

Instrumentation

FTIR Spectroscopy, Microscopy

Manufacturer

Agilent Technologies

Industries

SPME-GC/MS of 2,4,6-Trichloroanisole using an Agilent DVB/PDMS SPME Fiber

Applications

| 2019 | Agilent Technologies

GC/MSD, SPME, GC/SQ

Instrumentation

GC/MSD, SPME, GC/SQ

Manufacturer

Agilent Technologies

Industries

Food & Agriculture

Variable Angle Specular Reflectance Accessory (VASRA)

Brochures and specifications

| 2021 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Leveraging Cl-H Mass Defect Plots for the Identification of Halogenated Organic Contaminants

Post-Target Analysis of Halogenated Flame Retardants Using Mass Defect Plots

GC-APCI IMS of Diesel

Accurate Mass Analysis of Naphthenic Acids by Argon NCI

Identifying Disinfection Byproducts in Treated Water

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

7200 Series Q-TOF for GC/MS - A new analytical tool for solving complex analytical problems

Agilent Cary 610/620 FTIR microscopes and imaging systems

SPME-GC/MS of 2,4,6-Trichloroanisole using an Agilent DVB/PDMS SPME Fiber

Variable Angle Specular Reflectance Accessory (VASRA)

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