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    WCPS: Analytical Workflow for Elemental Extractables and Leachables in reference to USP and ICH Guidelines: Intravenous Bag Case Study

    Posters
    | 2017 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Pharma & Biopharma

    Food Safety Applications NotebookEnvironmental Contaminants - Environmental Contaminants

    Guides
    | 2012 | Thermo Fisher Scientific
    GC, Sample Preparation, Consumables, Ion chromatography, LC columns
    Instrumentation
    GC, Sample Preparation, Consumables, Ion chromatography, LC columns
    Manufacturer
    Agilent Technologies, Thermo Fisher Scientific
    Industries
    Environmental

    Improving the reliability and throughput of Halal products testing

    Others
    | 2013 | Agilent Technologies
    GC, GC/MSD, GC/MS/MS, HeadSpace, GC/SQ, GC/QQQ, HPLC, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/QQQ, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP/OES, FTIR Spectroscopy
    Instrumentation
    GC, GC/MSD, GC/MS/MS, HeadSpace, GC/SQ, GC/QQQ, HPLC, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/QQQ, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP/OES, FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Food & Agriculture

    Non-Destructive Analysis of Substrates and Contaminants by FTIR with Specular Reflectance Interface

    Applications
    | 2023 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Analysis of wear metals and contaminants in engine oils using the 4100 MP-AES

    Applications
    | 2011 | Agilent Technologies
    MP/ICP-AES
    Instrumentation
    MP/ICP-AES
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals

    Detection of trace contamination on metal surfaces using the handheld Agilent 4100 ExoScan FTIR

    Applications
    | 2015 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

    Applications
    | 2015 | Agilent Technologies
    GC, Speciation analysis, ICP/MS/MS
    Instrumentation
    GC, Speciation analysis, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Semiconductor Analysis

    Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Measurement of composite surface contamination using the Agilent 4100 ExoScan FTIR with diffuse reflectance sampling interface

    Applications
    | 2015 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

    Applications
    | 2001 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis
     

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