Effects of Filter Composition, Spectral Bandwidth, and Pathlength on Stray Light Levels in the Near-Infrared Region
Technical notes
| 2022 | Agilent Technologies
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Linearity Limits for Several Trace Metals Currently Determined by Electrothermal Atomic Absorption Spectrometry
Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Hollow Cathode Lamps – Yesterday, Today and Tomorrow
Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Digital Signal Processing in Polarization Modulation - Infrared Reflection Absorption Measurements
Technical notes
| N/A | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS
Technical notes
| 1995 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction
Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Features and Operation of Hollow Cathode Lamps and Deuterium Lamps
Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Using the Agilent Cary 670 FTIR Spectrometer to observe rotational and isotopic bands in CO through high resolution FTIR Spectroscopy