Applications | LabRulez ICPMS

The investigation of the photo- kinetics of a platinum organoamine complex using the Cary 50/60

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

ICP-MS Analysis of Trace Elements in LIB Cathode Materials

Applications

| 2022 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Monitoring Compliance with Heavy Metals Limits in Baby Food

Applications

| 2021 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Food & Agriculture

Measurement of composite surface contamination using the Agilent 4100 ExoScan FTIR with diffuse reflectance sampling interface

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

At site rock and mineral measurement using a handheld Agilent FTIR analyzer

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Environmental, Materials Testing

Identification and Evaluation of Coatings Using Hand-held FTIR

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Application of Spatially Offset Raman Spectroscopy to In-Container Testing of Raw Materials for PIC/S GMP Annex 8 Using the Agilent RapID Raman System

Applications

| 2018 | Agilent Technologies

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Ultratrace Analysis of Solar (Photovoltaic) Grade Bulk Silicon by ICP-MS

Applications

| 2008 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Composite thermal damage – correlation of short beam shear data with FTIR spectroscopy

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

The determination of thin film thickness using reflectance spectroscopy

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Applications | LabRulez ICPMS

The investigation of the photo- kinetics of a platinum organoamine complex using the Cary 50/60

ICP-MS Analysis of Trace Elements in LIB Cathode Materials

Monitoring Compliance with Heavy Metals Limits in Baby Food

Measurement of composite surface contamination using the Agilent 4100 ExoScan FTIR with diffuse reflectance sampling interface

At site rock and mineral measurement using a handheld Agilent FTIR analyzer

Identification and Evaluation of Coatings Using Hand-held FTIR

Application of Spatially Offset Raman Spectroscopy to In-Container Testing of Raw Materials for PIC/S GMP Annex 8 Using the Agilent RapID Raman System

Ultratrace Analysis of Solar (Photovoltaic) Grade Bulk Silicon by ICP-MS

Composite thermal damage – correlation of short beam shear data with FTIR spectroscopy

The determination of thin film thickness using reflectance spectroscopy

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