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    Applications | LabRulez ICPMS

    RoHS/ELV Directives - Measurement of Heavy Metals Using ICP-MS

    Applications
    | 2006 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Determination of the Priority Pollutant Metals – Regulations and Methodology

    Applications
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Identification and Evaluation of Coatings Using Hand-held FTIR

    Applications
    | 2015 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Ultratrace Analysis of Solar (Photovoltaic) Grade Bulk Silicon by ICP-MS

    Applications
    | 2008 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Aluminium Determinations in Parenteral Solutions

    Applications
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals

    Quantitative analysis of complex multi-component mixtures

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals

    SPANDS Colorimetric Method to Quantify Fluorides in Water

    Applications
    | 2023 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    SPADNS Colorimetric Method to Quantify Fluorides in Water

    Applications
    | 2023 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Determination of Trace Impurities in High-Purity Copper by Sequential ICP-OES with Axial Viewing

    Applications
    | 2010 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals

    Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

    Applications
    | 2001 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis
     

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