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Applications | LabRulez ICPMS
Measuring optical filters
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| 2011 | Agilent Technologies
UV–VIS spectrophotometry
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Optical Characterization of Thin Films
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Measuring the Optical Properties of Photovoltaic Cells
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Spectrophotometric Spatial Profiling of Coated Optical Wafers
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Agilent Technologies
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Optical Characteristics and Thickness of 2-layered Structures
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| 2018 | Agilent Technologies
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The Measurement of High Optical Densities in the Near-Infrared
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| 2022 | Agilent Technologies
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The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory
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| 2011 | Agilent Technologies
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Agilent Technologies
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Measuring the Performance of Compact Visual Displays
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| 2021 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films
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| 2011 | Agilent Technologies
UV–VIS spectrophotometry
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UV–VIS spectrophotometry
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