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Applications | LabRulez ICPMS
Selection of Operating Parameters for a New Boosted-Discharge Bismuth Lamp
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
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Agilent Technologies
Industries
Digital Transformation of a Biopharma Quality Control Lab
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| 2023 | Agilent Technologies
Software
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Software
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Agilent Technologies
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Pharma & Biopharma
Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS
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| 2003 | Agilent Technologies
ICP/MS
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ICP/MS
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Agilent Technologies
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Semiconductor Analysis
Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging
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| 2014 | Agilent Technologies
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Agilent Technologies
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Materials Testing, Semiconductor Analysis
Identification of Narcotics and Cutting Agents in Mixtures with the Agilent FTIR Forensics Analyzer Package
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| 2022 | Agilent Technologies
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Agilent Technologies
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Automated Analysis of Low-to-High Matrix Environmental Samples Using a Single ICP-MS Method
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| 2024 | Agilent Technologies
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Agilent Technologies
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Quantification of Release Agent on a Carbon-Fiber-Reinforced Polymer using a Hand-Held FTIR
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| 2018 | Agilent Technologies
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FTIR Spectroscopy
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Agilent Technologies
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Non-Destructive Evaluation of Composite Thermal Damage with Agilent’s New Handheld 4300 FTIR
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| 2014 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Monitoring Heavy Metals by ICP- OES for Compliance with RoHS and WEEE Directives
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| 2010 | Agilent Technologies
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ICP/OES
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Agilent Technologies
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Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ
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| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
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ICP/MS, ICP/MS/MS
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Agilent Technologies
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Semiconductor Analysis
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