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Selection of Operating Parameters for a New Boosted-Discharge Bismuth Lamp
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| 2010 | Agilent Technologies
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Agilent Technologies
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Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS
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| 2013 | Agilent Technologies
ICP/MS, ICP/MS/MS
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Semiconductor Analysis
Extending the Analytical Range for Gold Using Agilent UltrAA Lamps
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| 2010 | Agilent Technologies
AAS
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Agilent Technologies
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Environmental
Determination of Mercury With On-line Addition of Stannous Chloride Using an Axial ICP-OES
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| 2010 | Agilent Technologies
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Agilent Technologies
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Determination of Trace Impurities in High-Purity Copper by Sequential ICP-OES with Axial Viewing
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| 2010 | Agilent Technologies
ICP-OES
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Agilent Technologies
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Improved Measurement of Liquid Samples Using FTIR
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| 2021 | Agilent Technologies
FTIR Spectroscopy
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FTIR Spectroscopy
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Agilent Technologies
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Improving Throughput for Oils Analysis by ICP-OES
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| 2010 | Agilent Technologies
ICP-OES
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Agilent Technologies
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Agilent Beam Enhancer Technology for High-Speed Transmission Raman Spectroscopy
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| 2018 | Agilent Technologies
RAMAN Spectroscopy
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RAMAN Spectroscopy
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Agilent Technologies
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Pharma & Biopharma
The ultratrace determination of iodine 129 using the Agilent 8800 Triple Quadrupole ICP-MS in MS/MS mode
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| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
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Agilent Technologies
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Trace Metal Analysis of Waters using the Carbon Rod Atomizer — a Review
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| 2010 | Agilent Technologies
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Agilent Technologies
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