Use of Drierite Trap to Extend the Lifetimeof Vapor Generation Absorption Cell

Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries

The Direct Analysis of Milk Powder on the Liberty Series II ICP-OES with the Axially-Viewed Plasma

Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Food & Agriculture

A Fast Method of Studying the Impact of Temperature on Chemical Reactions

Applications
| 2018 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Imaging of Live Cells in Water Using an Agilent 620 FTIR Microscope and an Agilent Cary 670 FTIR System Equipped with Standard Thermal Source

Applications
| 2016 | Agilent Technologies
FTIR Spectroscopy, Microscopy
Instrumentation
FTIR Spectroscopy, Microscopy
Manufacturer
Agilent Technologies
Industries
Clinical Research

Support for Title 21 CFR Part 11 and Annex 11 Compliance: Agilent OpenLab Server and OpenLab ECM XT

Technical notes
| 2024 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
Other

Support for Title 21 CFR Part 11 and Annex 11 Compliance: Agilent Cary WinUV Pharma

Technical notes
| 2016 | Agilent Technologies
Software, UV–VIS spectrophotometry
Instrumentation
Software, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Benefits of the Cary 3500 Multicell UV-Vis for Protein Analysis

Applications
| 2018 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Clinical Research

The determination of thin film thickness using reflectance spectroscopy

Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing

Selection of Operating Parameters for a New Boosted-Discharge Bismuth Lamp

Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
LCMS
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