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Eliminate the Dilution Step from ICP-MS Sample Prep with the Agilent High Matrix Introduction System
Technical notes
| 2008 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Effects of Filter Composition, Spectral Bandwidth, and Pathlength on Stray Light Levels in the Near-Infrared Region
Technical notes
| 2022 | Agilent Technologies
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Health Checks for Flame and Graphite Furnace AAS
Technical notes
| 2021 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
High Volume Optical Component Testing
Applications
| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS
Applications
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS
Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
High-Speed Environmental Analysis Using the Agilent 7500cx with Integrated Sample Introduction System – Discrete Sampling (ISIS–DS)
Applications
| 2009 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
The Measure of Purity - Water quality applications
Guides
| 2019 | Agilent Technologies
GC/MSD, GC/MS/MS, HeadSpace, Purge and Trap, GC/SQ, GC/QQQ, Consumables, HPLC, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/QQQ, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, GD/MP/ICP-AES
Instrumentation
GC/MSD, GC/MS/MS, HeadSpace, Purge and Trap, GC/SQ, GC/QQQ, Consumables, HPLC, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC/QQQ, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, GD/MP/ICP-AES
Manufacturer
Agilent Technologies, Elemental Scientific
Industries
Environmental
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike