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Determination of trace amounts of Mercury (II) by Total Fluorescence Quenching using 1,10-phenanthroline and eosin

Applications
| 2012 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Environmental

Investigations into the use of helium collision mode and aerosol dilution for ultra-trace analysis of metals in mineral reference materials

Applications
| 2013 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Microwave Plasma Atomic Emission Spectroscopy (MP-AES)

Guides
| 2021 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma

Routine Analysis of Soils using ICP-MS and Discrete Sampling

Applications
| 2021 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Simple, Reliable Analysis of High Matrix Samples According to US EPA Method 6020A ICP-MS

Applications
| 2021 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Agilent ICP-MS Journal (November 2015 – Issue 63)

Others
| 2016 | Agilent Technologies
Software, ICP/MS, ICP/MS/MS
Instrumentation
Software, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Analysis of Trace Elements in Water Samples per ISO 17294-2

Applications
| 2020 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

WCPS: The Analysis of Titanium Nanoparticles in artificial and natural sweeteners by the Agilent 8900 QQQ-ICPMS

Posters
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture

Determination of metals in industrial wastewaters by microwave plasma- atomic emission spectrometry

Applications
| 2011 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike