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Publication Date
Practical Multi-Element Hollow Cathode Lamps for Atomic Absorption Spectrometry
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction
Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Determination of Trace Impurities in High-Purity Copper by Sequential ICP-OES with Axial Viewing
Applications
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Features and Operation of Hollow Cathode Lamps and Deuterium Lamps
Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Selection of Operating Parameters for a New Boosted-Discharge Bismuth Lamp
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
SmartRinse — Maximizing throughput
Technical notes
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
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Agilent Technologies
Industries
AutoMax — Fast, automated method optimization
Technical notes
| 2010 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Extending the Analytical Range for Gold Using Agilent UltrAA Lamps
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| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
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Agilent Technologies
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Environmental
Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software
Technical notes
| 2021 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
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Agilent Technologies
Industries
FACT spectral deconvolution
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
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