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Routine determination of trace rare earth elements in high purity Nd2 O3 using the Agilent 8800 ICP-QQQ
Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS
Applications
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
APWC: Investigation of ICP-MS/MS using oxygen or hydrogen as a reaction gas for interference-free analysis of phosphorus in organic solvents
Posters
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Ultratrace measurement of calcium in ultrapure water using the Agilent 8800 Triple Quadrupole ICP-MS
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| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
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Agilent Technologies
Industries
Semiconductor Analysis
Technical Overview and Performance Capability of the Agilent 7900s ICP-MS for Semiconductor Applications
Technical notes
| 2020 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
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Agilent Technologies
Industries
Semiconductor Analysis
APWC: Arsenic(As) and Selenium(Se) analysis in presence of Rare Earth Elements (REEs) by single quadrupole ICP-MS
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| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
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Agilent Technologies
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Environmental, Food & Agriculture
Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode
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| 2014 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Automated Analysis of Ultratrace Elemental Impurities in Isopropyl Alcohol
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| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
WCPS: Trace Level Analysis of V, As and Se Using He Cell Gas via Kinetic Energy Discrimination and Collisional Dissociation in Acidic Matrices
Posters
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ
Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
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