Measuring baseline-corrected spectra on a Cary 60 UV-Vis
Technical notes
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
ICP Expert II Software and ICP Expert II with 21 CFR Part 11 Software Status Bulletin
Manuals
| 2013 | Agilent Technologies
Software, ICP/OES
Instrumentation
Software, ICP/OES
Manufacturer
Agilent Technologies
Industries
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Trace Metals in Water & Waste Samples Using an Agilent 7850 or 7900 ICP-MS
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