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Analysis of steel and its alloys using the GB/T 20125-2006 standard and an Agilent 5100 ICP-OES in dual view mode
Applications
| 2015 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing
Improved productivity for the determination of metals in oil samples with ASTM Method D5185, using the Agilent 5100 Radial View (RV) ICP-OES
Applications
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Analysis of 10 nm gold nanoparticles using the high sensitivity of the Agilent 8900 ICP-QQQ
Applications
| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture, Materials Testing
Determination of Chloride in Crude Oils using an Agilent 8900 ICP-QQQ
Applications
| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS
Applications
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Agilent ICP-MS Journal (July 2020, Issue 81)
Others
| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS, Laser ablation
Instrumentation
ICP/MS, ICP/MS/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Environmental
Elemental Analysis of Crude, Used Engine, and Hydraulic Oils by Radial View (RV) ICP-OES
Applications
| 2021 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
WCPS: Particle Analysis of Two High Purity Grades of N-Methyl-2- Pyrrolidone (NMP) using Single Particle (sp)ICP-MS/MS Method
Posters
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Other projects
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike