ICPMS
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Ultra-fast ICP-OES determinations of base metals in geochemical samples using next generation sample introduction technology

Applications
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental

WCPS: Reaction Cell Frontier: Analysis of Radionuclides in Environmental Samples using an Innovative Reaction Cell ICP--MSMS

Posters
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Routine soil analysis using an Agilent 8800 ICP-QQQ

Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Routine determination of trace rare earth elements in high purity Nd2 O3 using the Agilent 8800 ICP-QQQ

Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples

Technical notes
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications
| 2020 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Agilent ICP-MS Journal (July/August 2015 – Issue 62)

Others
| 2015 | Agilent Technologies
GC, Software, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Software, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Measuring Multiple Elements in Steel Samples Using FAAS With Automated Standard Preparation and Sample Dilution

Applications
| 2021 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental

Measuring Inorganic Impurities in Semiconductor Manufacturing

Guides
| 2022 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Benefits of Transitioning From Flame AAS to the 4210 MP-AES

Technical notes
| 2020 | Agilent Technologies
AAS, GD/MP/ICP-AES
Instrumentation
AAS, GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
LCMS
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike