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ANALYSIS OF EXTRACTABLE AND LEACHABLE METALS IN PLASTIC MATERIALS OF CONSTRUCTION AS PER USP <661.1> ACID EXTRACTION PROCEDURE USING THE AGILENT 5110 VDV ICP-OES
Applications
| 2016 | Agilent Technologies
LC/Orbitrap, ICP-OES
Instrumentation
LC/Orbitrap, ICP-OES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Analysis of Blood Serum on the Liberty Series II ICP OES with the Axially- Viewed Plasma
Applications
| 2015 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Clinical Research
Measuring optical filters
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
High sensitivity analysis of SiO2 nanoparticles using the Agilent 8900 ICP-QQQ in MS/MS mode
Applications
| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture, Materials Testing
Determination of titanium dioxide nanoparticles in milk samples by single particle ICP-QQQ
Posters
| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
WCPS: Elemental profiles of whiskies allow differentiation by type and region by inductively coupled plasma – optical emission spectroscopy (ICP-OES)
Posters
| 2017 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Determination of Metals in Cannabis and Cannabis-related Samples using ICP-OES and ICP-MS
Posters
| 2018 | Agilent Technologies (AOAC)
ICP/MS, ICP-OES
Instrumentation
ICP/MS, ICP-OES
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
The deep ultraviolet spectroscopic properties of a next-generation photoresist
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike