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WCPS: New Standardized Methods for Metals in Cannabis
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| 2023 | Agilent Technologies
ICP/MS
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Agilent Cary 4000 5000 6000i UV-Vis-NIR - Site Preparation Checklist
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| 2023 | Agilent Technologies
UV–VIS spectrophotometry
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A Faster, More Accurate Way of Characterizing Cube Beamsplitters
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| 2022 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Materials Testing
A Faster, More Accurate Way of Characterizing Cube Beamsplitters
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| 2022 | Agilent Technologies
UV–VIS spectrophotometry
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UV–VIS spectrophotometry
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Agilent Technologies
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Spectrophotometric Spatial Profiling of Coated Optical Wafers
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| 2020 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Agilent Cary 3500 UV-Vis Systems Site Preparation Checklist
Manuals
| 2020 | Agilent Technologies
UV–VIS spectrophotometry
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UV–VIS spectrophotometry
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Agilent Technologies
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Investigation of Dichroism by Spectrophotometric Methods
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| 2019 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
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Materials Testing
Synchronous Vertical Dual View (SVDV) for High Productivity and Low Cost of Ownership
Technical notes
| 2019 | Agilent Technologies
ICP-OES
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ICP-OES
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Agilent Technologies
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