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Publication Date
Applications from LECO - page 27
Fastick™ System with SiC Grinding
Applications
| 2013 | LECO
Sample Preparation, Consumables
Instrumentation
Sample Preparation, Consumables
Manufacturer
LECO
Industries
Materials Testing
Moisture in Welding Flux
Applications
| 2003 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing
Quantitative Depth Profile (QDP) Analysis of Cr Marker in Alumina Sample
Applications
| 2010 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing
Determination of Sulfur in Fertilizers
Applications
| 2018 | LECO
Elemental Analysis
Instrumentation
Elemental Analysis
Manufacturer
LECO
Industries
Energy & Chemicals , Food & Agriculture
Quantitative Depth Profile (QDP) Analysis of 40 GB Hard Disk on Glass Substrate
Applications
| 2010 | LECO
Elemental Analysis, GD/MP/ICP-AES
Instrumentation
Elemental Analysis, GD/MP/ICP-AES
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Compositional Depth Profiling of Hard Disks with Glow Discharge Atomic Emission Spectrometry (GD-AES)
Applications
| 2016 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing
Quantitative Depth Profile (QDP) Analysis of Thin Oxide Layer on Polished Stainless Steel
Applications
| 2010 | LECO
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
LECO
Industries
Energy & Chemicals , Materials Testing
Quantitative Depth Profile (QDP) Analysis of Galvannealed Steel
Applications
| 2010 | LECO
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
LECO
Industries
Energy & Chemicals , Materials Testing
Quantitative Depth Profile (QDP) Analysis of Commercial Hard Disk on Aluminum Alloy Substrate
Applications
| 2010 | LECO
Elemental Analysis, GD/MP/ICP-AES
Instrumentation
Elemental Analysis, GD/MP/ICP-AES
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Quantitative Depth Profile (QDP) Analysis of NIST 2135c - Ni/Cr Thin Film Depth Profile Standard
Applications
| 2010 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing
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