Applications from Agilent Technologies, LECO - page 1

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Evaluation of High Intensity Lamps for AAS

Applications

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Oxygen in Aluminum and Aluminum Alloys

Applications

| 2009 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Oxygen in Aluminum and Aluminum Alloys (TC500-Series)

Applications

| 2009 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Oxygen in Aluminum and Aluminum Alloys (TC600-Series)

Applications

| 2009 | LECO

Elemental Analysis

Instrumentation

Elemental Analysis

Manufacturer

LECO

Industries

Materials Testing, Energy & Chemicals

Determination of Elemental Impurities in Copper Sulfate using ICP-OES

Applications

| 2023 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Environmental, Energy & Chemicals

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Measuring the Optical Properties of Photovoltaic Cells

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing