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    Applications from Agilent Technologies | LabRulez ICPMS

    Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS, Laser ablation
    Instrumentation
    ICP/MS, ICP/MS/MS, Laser ablation
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Spectrophotometric Spatial Profiling of Coated Optical Wafers

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

    Applications
    | 2001 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Molecular Spectroscopy Application eHandbook

    Guides
    | 2017 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry, FTIR Spectroscopy
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry, FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Materials Testing

    Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

    Applications
    | 2003 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Agilent Atomic Spectroscopy Solutions for the Semiconductor Industry

    Guides
    | 2020 | Agilent Technologies
    ICP/MS, ICP/OES, AAS, ICP/MS/MS, MP/ICP-AES
    Instrumentation
    ICP/MS, ICP/OES, AAS, ICP/MS/MS, MP/ICP-AES
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Agilent ICP-MS Journal (April 2018. Issue 72)

    Others
    | 2018 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Food & Agriculture, Semiconductor Analysis

    Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ

    Applications
    | 2018 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis
     

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