Applications from Agilent Technologies

Composite thermal damage – correlation of short beam shear data with FTIR spectroscopy

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Trace level analysis of sulfur, phosphorus, silicon and chlorine in NMP using the Agilent 8800 Triple Quadrupole ICP-MS

Applications

| 2013 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Pharma & Biopharma

Measuring Inorganic Impurities in Semiconductor Manufacturing

Guides

| 2022 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Guides

| 2022 | Agilent Technologies

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies, Elemental Scientific

Industries

Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research

Excellent choices for environmental applications - Water

Guides

| 2009 | Agilent Technologies

GC, GC/MSD, HeadSpace, SPME, Purge and Trap, Sample Preparation, GC/SQ, GC columns, Consumables, Software, HPLC, Ion chromatography, LC/TOF, LC/MS, LC/MS/MS, LC/QQQ, LC/SQ, Capillary electrophoresis, LC/IT, ICP/MS, Speciation analysis, Laser ablation

Instrumentation

GC, GC/MSD, HeadSpace, SPME, Purge and Trap, Sample Preparation, GC/SQ, GC columns, Consumables, Software, HPLC, Ion chromatography, LC/TOF, LC/MS, LC/MS/MS, LC/QQQ, LC/SQ, Capillary electrophoresis, LC/IT, ICP/MS, Speciation analysis, Laser ablation

Manufacturer

Agilent Technologies, Metrohm

Industries

Environmental, Food & Agriculture

Applications from Agilent Technologies | LabRulez ICPMS

Composite thermal damage – correlation of short beam shear data with FTIR spectroscopy

Trace level analysis of sulfur, phosphorus, silicon and chlorine in NMP using the Agilent 8800 Triple Quadrupole ICP-MS

Measuring Inorganic Impurities in Semiconductor Manufacturing

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Excellent choices for environmental applications - Water

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