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Applications from Agilent Technologies | LabRulez ICPMS
Measuring the reflective properties of architectural glass using the Agilent Cary 630 FTIR with 10 degree Specular Refl ectance Accessory
Applications
| 2013 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Determining the effects of angle on the infra-red reflectance properties of thin films in architectural glass using the Agilent Cary 630 FTIR
Applications
| 2013 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Comparison of Portable FTIR Interface Technologies for the Analysis of Paints, Minerals & Concrete
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| 2017 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
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Agilent Technologies
Industries
Materials Testing
Evaluation of the Cary Absolute Specular Reflectance accessory for the measurement of optical constants of thin films
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| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
The determination of thin film thickness using reflectance spectroscopy
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
Evaluation of the Cary Absolute Specular Reflectance Accessory for the Measurement of Optical Constants of Thin Films
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| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
Industries
Materials Testing
Measuring the Optical Properties of Photovoltaic Cells
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| 2023 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
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NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
Industries
Materials Testing
Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
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| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
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Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
The deep ultraviolet spectroscopic properties of a next-generation photoresist
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| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory
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| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
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