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    Applications from Agilent Technologies | LabRulez ICPMS

    Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction

    Technical notes
    | 2019 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction

    Technical notes
    | 2014 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    ‘Fitted’ — Fast, accurate and fully- automated background correction

    Technical notes
    | 2012 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Measuring baseline-corrected spectra on a Cary 60 UV-Vis

    Technical notes
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    Measurement of Chromium in Environmental Waters by Zeeman Corrected Graphite Tube Atomization

    Applications
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Simplifying Correction of Doubly Charged Ion Interferences with Agilent ICP-MS MassHunter

    Technical notes
    | 2019 | Agilent Technologies
    Software, ICP/MS
    Instrumentation
    Software, ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    Fitting Deuterium Lamp Background Correction to Agilent 50/55 AA Instruments

    Manuals
    | 2012 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries

    Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software

    Technical notes
    | 2021 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS

    Technical notes
    | 1995 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries

    FACT spectral deconvolution

    Technical notes
    | 2012 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
     

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