Measurement of composite surface contamination using the Agilent 4100 ExoScan FTIR with diffuse reflectance sampling interface
Applications
| 2015 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Measuring Ultra-Trace Levels of Mercury
Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Resilient Vertical Torch Means Less Cleaning, Less Downtime, and Fewer Replacements—Even for Tough Samples
Technical notes
| 2019 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Smart Self-Health Checks for ICP-MS Instruments
Others
| 2020 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Handheld FTIR analysis for the conservation and restoration of fine art and historical objects
Applications
| 2015 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Materials Testing
Agilent MP-AES Long Term Shut Down and Start up Instructions