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    Applications from Agilent Technologies | LabRulez ICPMS

    Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS, Laser ablation
    Instrumentation
    ICP/MS, ICP/MS/MS, Laser ablation
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Spectrophotometric Spatial Profiling of Coated Optical Wafers

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

    Applications
    | 2001 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

    Applications
    | 2003 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ

    Applications
    | 2018 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Investigating the Angular Dependence of Absolute Specular Reflection

    Applications
    | 2022 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS

    Applications
    | 2013 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    The deep ultraviolet spectroscopic properties of a next-generation photoresist

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis
     

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