Applications from Agilent Technologies | LabRulez ICPMS

Detection of trace contamination on metal surfaces using the handheld Agilent 4100 ExoScan FTIR

Applications

| 2015 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Optical Characterization of Thin Films

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Applications

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Determining the effects of angle on the infra-red reflectance properties of thin films in architectural glass using the Agilent Cary 630 FTIR

Applications

| 2013 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

Optical Characteristics and Thickness of 2-layered Structures

Applications

| 2018 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Automated, unattended multi-angle transmission and absolute refl ection measurements on architectural and automotive glass using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Applications

| 2013 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Gaining Deeper Insights into Thin Film Response

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Handheld FTIR spectroscopy applications using the Agilent ExoScan 4100 FTIR with diffuse sample interface

Applications

| 2011 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

Applications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Applications from Agilent Technologies | LabRulez ICPMS

Detection of trace contamination on metal surfaces using the handheld Agilent 4100 ExoScan FTIR

Optical Characterization of Thin Films

Characterizing Sub-Nanometer Narrow Bandpass Filters Using an Agilent Cary UV-Vis-NIR

Determining the effects of angle on the infra-red reflectance properties of thin films in architectural glass using the Agilent Cary 630 FTIR

Optical Characteristics and Thickness of 2-layered Structures

Automated, unattended multi-angle transmission and absolute refl ection measurements on architectural and automotive glass using the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Gaining Deeper Insights into Thin Film Response

Handheld FTIR spectroscopy applications using the Agilent ExoScan 4100 FTIR with diffuse sample interface

A Faster, More Accurate Way of Characterizing Cube Beamsplitters

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