Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Agilent ICP-MS Journal (January 2013 – Issue 52)
Others
| 2013 | Agilent Technologies
Software, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
Software, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Determination of Elemental Impurities in Copper Sulfate using ICP-OES
Applications
| 2023 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental, Energy & Chemicals
Digital Signal Processing in Polarization Modulation - Infrared Reflection Absorption Measurements
Technical notes
| N/A | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Reaction data for 70 elements using O2 , NH3 and H2 gases with the Agilent 8800 Triple Quadrupole ICP-MS
Technical notes
| 2014 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Data Integrity in Pharmaceutical Quality Control Laboratories: What You Need to Know
Technical notes
| 2016 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
Pharma & Biopharma
Enhanced RoHS Compliance Testing with Agilent 5800 ICP-OES