Applications from Agilent Technologies - page 23

Optimizing Microplastic Characterization by LDIR: Automated versus Manual Workflows

Technical notes

| 2025 | Agilent Technologies

FTIR Spectroscopy, Particle size analysis

Instrumentation

FTIR Spectroscopy, Particle size analysis

Manufacturer

Agilent Technologies

Industries

Materials Testing

Spectrophotometric Spatial Profiling of Coated Optical Wafers

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

Analysis of Heavy Metals in e-Liquids using the Agilent 5110 ICP-OES

Applications

| 2018 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Food & Agriculture

High Spatial resolution FTIR imaging of biomedical tissue samples using a novel method of magnification enhancement

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy, Microscopy

Instrumentation

FTIR Spectroscopy, Microscopy

Manufacturer

Agilent Technologies

Industries

Clinical Research

Ultra-fast ICP-OES determinations of base metals in geochemical samples using next generation sample introduction technology

Applications

| 2012 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Environmental

Fast and Reliable Analysis of Soil and Sediments using ICP-MS with an Innovative Cell

Applications

| 2026 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental

Agilent Atomic Spectroscopy Solutions for the Semiconductor Industry

Guides

| 2020 | Agilent Technologies

ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES

Instrumentation

ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Measuring Inorganic Impurities in Semiconductor Manufacturing

Guides

| 2022 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Ion Pump Troubleshooting

Technical notes

| 2023 | Agilent Technologies

GC/MSD, LC/MS, ICP/MS

Instrumentation

GC/MSD, LC/MS, ICP/MS

Manufacturer

Agilent Technologies

Industries

Analysis of 50 nm Silica Nanoparticles in Semiconductor Process Chemicals by spICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis