Applications from Agilent Technologies - page 21

Rapid Analysis of High-Matrix Environmental Samples Using the Agilent 7500cx ICP-MS

Technical notes

| 2007 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental

Fluorescence in Microvolumes: 30uL Volumes in 384 Well Microplates

Technical notes

| 2007 | Agilent Technologies

Fluorescence spectroscopy

Instrumentation

Fluorescence spectroscopy

Manufacturer

Agilent Technologies

Industries

Measuring Relative % Reflectance of Small Samples in a Cary 50 Spectrophotometer

Technical notes

| 2007 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Unmatched Removal of Spectral Interferences in ICP-MS Using the Agilent Octopole Reaction System with Helium Collision Mode

Technical notes

| 2006 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Achieving Optimum Throughput in ICP-MS Analysis of Environmental Samples with the Agilent 7500ce ICP-MS

Technical notes

| 2006 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental

A Comparison of the Relative Cost and Productivity of Traditional Metals Analysis Techniques Versus ICP-MS in High Throughput Commercial Laboratories

Technical notes

| 2005 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Applications of ICP-MS in Homeland Security

Technical notes

| 2004 | Agilent Technologies

GC, ICP/MS, Speciation analysis

Instrumentation

GC, ICP/MS, Speciation analysis

Manufacturer

Agilent Technologies

Industries

Homeland Security

Introduction to Laser Ablation ICP-MS for the Analysis of Forensic Samples

Technical notes

| 2004 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Forensics

Evaluation of Deuterium and Zeeman Background Correction with the Presence of Spectral Interferences Determinations of Arsenic in an Aluminium Matrix and Selenium in an Iron Matrix by GFAAS

Technical notes

| 1995 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

AA Troubleshooting and Maintenance Guide

Technical notes

| N/A | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries