Applications from Agilent Technologies | LabRulez ICPMS
Determination of P, Si and S in acid digested lubricating oil using the Agilent 8800 Triple Quadrupole ICP-MS
Applications
| 2014 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 Microwave Plasma-Atomic Emission Spectrometer
Applications
| 2016 | Agilent Technologies
MP/ICP-AES
Instrumentation
MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Determination of trace elements in steel using the Agilent 7900 ICP-MS
Applications
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Analysis of Steel and Its Alloys by ICP-OES Following the GB/T 20125- 2006 Standard
Applications
| 2022 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Analysis of Pb and Cr in Soil using Graphite Furnace Atomic Absorption Spectrometry
Applications
| 2021 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental
Rapid Measurement of Major, Minor and Trace Levels in Soils Using the Agilent 730-ES
Applications
| 2010 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Environmental
Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ
Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Monitoring Heavy Metals by ICP- OES for Compliance with RoHS and WEEE Directives
Applications
| 2010 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Determination of Major and Minor Elements in HF-Digested Soil Samples using an Agilent 5110 ICP-OES