ICPMS
Menu
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike
Language Čeština

    1. Databases

    1. Industries

    1. Instrumentation

    1. Manufacturer

    1. Author

    1. Content Type

    1. Publication Date

    Applications from Agilent Technologies | LabRulez ICPMS

    Direct Analysis of Trace Metal Impurities in High Purity Nitric Acid Using ICP-QQQ

    Applications
    | 2018 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Analysis of Ultratrace Impurities in High Silicon Matrix Samples by ICP-QQQ

    Applications
    | 2021 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS

    Applications
    | 2013 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Rapid Multi-Elemental Analysis of Fertilizers using the Agilent 5110 VDV ICP-OES

    Applications
    | 2019 | Agilent Technologies
    ICP/OES
    Instrumentation
    ICP/OES
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    The Measurement of Silicon, Tin, and Titanium in Jet-Engine Oil

    Applications
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals

    Routine soil analysis using an Agilent 8800 ICP-QQQ

    Applications
    | 2015 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS

    Applications
    | 2023 | Agilent Technologies
    ICP/MS, ICP/MS/MS, Laser ablation
    Instrumentation
    ICP/MS, ICP/MS/MS, Laser ablation
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis
     

    Related content

    ‌

    New approach enhances muscle recovery in aged mice

    We, 22.5.2024
    University of Illinois Urbana-Champaign
    ‌

    Scientists from IOCB Prague are expanding the possibilities of using RNA in gene medicine

    Tu, 21.5.2024
    Ústav organické chemie a biochemie AV ČR
    ‌

    Virus attacking coccolithophore – marine alga that affects the Earth’s climate

    Su, 19.5.2024
    CEITEC
    ‌
    Other projects
    Follow us
    More information
    WebinarsAbout usContact usTerms of use
    LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike