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Applications from Agilent Technologies - page 15
ICP-OES Productivity Package
Technical notes
| 2013 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Measuring optical densities over 10 Abs on the Agilent Cary 7000 Universal Measurement Spectrophotometer (UMS)
Technical notes
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Update to the UV-Visible ChemStation method for testing photometric accuracy in the ultraviolet region of the spectrum
Technical notes
| 2013 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Agilent Cary Universal Measurement Accessory (UMA)
Technical notes
| 2013 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
UltrAA lamps — Increase sensitivity by up to 40%
Technical notes
| 2013 | Agilent Technologies
Consumables, AAS
Instrumentation
Consumables, AAS
Manufacturer
Agilent Technologies
Industries
VGA 77 — High productivity vapor generation
Technical notes
| 2013 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Dedicated axial or radial plasma view for superior speed and performance
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
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