WCPS: ADVANCING PEFORMANCE OF AN AXIALLY VIEWED INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETER FOR SAMPLES HIGH SOLIDS BY INNOVATIVE TORCH DESIGN
Posters
| 2011 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Optimum parameters for UV-VIS-NIR spectroscopy
Posters
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
The Agilent Cary 60 eliminates photodegradation of aromatic markers used in UV-Vis spectrophotometric applications
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Characterizing sub-nanometer narrow bandpass filters using a Cary 400/500
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
The characterization of optical components using the Cary Deep UV spectrophotometer and ‘VW’ specular reflectance accessory
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing
The deep ultraviolet spectroscopic properties of a next-generation photoresist
Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
GC instrumentation and technology update
Presentations
| 2010 | Agilent Technologies
GC, GC/MSD, Sample Preparation, GC/SQ
Instrumentation
GC, GC/MSD, Sample Preparation, GC/SQ
Manufacturer
Agilent Technologies
Industries
WCPS: Trace Level Analysis of V, As and Se Using He Cell Gas via Kinetic Energy Discrimination and Collisional Dissociation in Acidic Matrices
Posters
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
WCPS: Performance evaluation of Helium Mode ICP-MS for high-matrix sample types in a high-throughput European laboratory