WCPS: Authenticating Geographical Origin of Tea from the North- East Region of India Using ICP-MS and Agilent Mass Profiler Professional Chemometrics Software
Posters
| 2023 | Agilent Technologies
Software, ICP/MS
Instrumentation
Software, ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
ICP-OES Analysis of Electrolytes for All-Vanadium Redox Flow Batteries
Applications
| 2024 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Determination of 14 Impurity Elements in Lithium Carbonate Using ICP-OES
Applications
| 2020 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental
Determination of 14 Impurity Elements in Lithium Carbonate Using ICP-OES
Applications
| 2020 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Environmental
Agilent 5800/5900 and 5100/5110 ICP-OES supplies
Guides
| 2024 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Agilent IDP-35 and IDP-45 Dry Scroll Pumps
Brochures and specifications
| 2024 | Agilent Technologies
GC/MSD, LC/MS, ICP/MS
Instrumentation
GC/MSD, LC/MS, ICP/MS
Manufacturer
Agilent Technologies
Industries
Agilent G3835AA MassHunter Mass Profiler Professional Software - Familiarization Guide
Manuals
| 2012 | Agilent Technologies
Software
Instrumentation
Software
Manufacturer
Agilent Technologies
Industries
Analysis of steel and its alloys using the GB/T 20125-2006 standard and an Agilent 5100 ICP-OES in dual view mode
Applications
| 2015 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Materials Testing
Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode
Applications
| 2014 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
From Routine Multi-element Analysis to Detecting Nanoparticles: using 7800 ICP-MS to Fully Characterize Infant Formula