Validating the Agilent 7700x/7800 ICP-MS for the determination of elemental impurities in pharmaceutical ingredients according to draft USP general chapters <232>/<233>
Applications
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Agilent 8800 Triple Quadrupole ICP-MS
Brochures and specifications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
AGILENT CROSSLAB SOLUTIONS FOR FAMILIARIZATION
Others
| 2015 | Agilent Technologies
Instrumentation
Manufacturer
Agilent Technologies
Industries
7700 Series ICP-MS – Site Preparation Checklist
Manuals
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Direct determination of Cu, Fe, Mn, P, Pb and Ti in HF acid-digested soils using the Agilent 4200 Microwave Plasma- Atomic Emission Spectrometer
Applications
| 2015 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental
High throughput determination of inorganic arsenic in rice using hydride generation-ICP-MS
Applications
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Determination of trace elements in steel using the Agilent 7900 ICP-MS
Applications
| 2015 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Fast and accurate absolute-quantification of proteins and antibodies using Isotope Dilution-Triple Quadrupole ICP-MS
Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Proteomics
Quantitative analysis of high purity metals using laser ablation coupled to an Agilent 7900 ICP-MS
Applications
| 2015 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Analysis of steel and its alloys using the GB/T 20125-2006 standard and an Agilent 5100 ICP-OES in dual view mode