Applications from Agilent Technologies - page 10

Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ

Applications

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Microwave Plasma Atomic Emission Spectroscopy (MP-AES) - Measuring metals in wine and food handbook

Guides

| 2022 | Agilent Technologies

GD/MP/ICP-AES

Instrumentation

GD/MP/ICP-AES

Manufacturer

Agilent Technologies, CEM

Industries

Food & Agriculture

Enhancing the productivity of food sample analysis with ICP-MS

Applications

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Food & Agriculture

Analysis of steel and its alloys using the GB/T 20125-2006 standard and an Agilent 5100 ICP-OES in dual view mode

Applications

| 2015 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing

Agilent 5110 ICP-OES Specifications

Brochures and specifications

| 2016 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Factors That Affect Performance of Laser Ablation (LA)-ICP-MS

Technical notes

| 2022 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Determination of Trace Elements in a Xylene Solution of Oil By ICP-OES with Ultrasonic Nebulization and Membrane Desolvation

Applications

| 2010 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS

Applications

| 2013 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Increase productivity for environmental sample analysis using the SVS 2+ Switching Valve System for Agilent 5100 SVDV ICP-OES

Technical notes

| 2015 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

Applications

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis