ICPMS
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike
    1. Databases

    1. Industries

    1. Instrumentation

    1. Manufacturer

    1. Author

    1. Content Type

    1. Publication Date

    Applications from Agilent Technologies | LabRulez ICPMS

    Spectrophotometric Methods of Refractive Indices Measurement

    Applications
    | 2019 | Agilent Technologies
    Fluorescence spectroscopy
    Instrumentation
    Fluorescence spectroscopy
    Manufacturer
    Agilent Technologies
    Industries

    Optical Characteristics and Thickness of 2-layered Structures

    Applications
    | 2018 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Variable Angle Specular Reflectance Accessory (VASRA)

    Brochures and specifications
    | 2021 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    AGILENT VARIABLE ANGLE SPECULAR REFLECTANCE ACCESSORY (VASRA)

    Brochures and specifications
    | 2013 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    Optical Characterization of Thin Films

    Applications
    | 2022 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    The determination of thin film thickness using reflectance spectroscopy

    Applications
    | 2011 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Quality Control of Beam Splitters and Quarter-Wave-Mirrors

    Technical notes
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Optical Characterization of Materials Using Spectroscopy

    Guides
    | 2023 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Energy & Chemicals , Materials Testing, Semiconductor Analysis

    Agilent Certified Pre-Owned Instruments

    Others
    | 2018 | Agilent Technologies
    GC, GC/MSD, GC/SQ, HPLC, ICP/OES
    Instrumentation
    GC, GC/MSD, GC/SQ, HPLC, ICP/OES
    Manufacturer
    Agilent Technologies
    Industries

    Investigation of Dichroism by Spectrophotometric Methods

    Applications
    | 2019 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing
     

    Related content


    From a scientific project to a global business venture. The company mzio is striving to improve data analysis in mass spectrometry labs

    We, 29.5.2024
    Ústav organické chemie a biochemie AV ČR

    Cryo-EM structures show how Trypanosomes escape the human innate immune response

    Tu, 28.5.2024
    Ústav organické chemie a biochemie AV ČR

    An innovative approach to planar chiral substances

    Mo, 27.5.2024
    Katedra organické chemie Přírodovědecké fakulty Univerzity Karlovy
    Other projects
    Follow us
    More information
    WebinarsAbout usContact usTerms of use
    LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike