Applications from Agilent Technologies | LabRulez ICPMS

Optical Characteristics and Thickness of 2-layered Structures

Applications

| 2018 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing

The Determination of Metals in Chlorinated Hydrocarbons by Flame Atomic Absorption

Applications

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Applications

| 2014 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Analyzing Colored Microplastics with the Agilent 8700 Laser Direct Infrared (LDIR) Chemical Imaging System

Applications

| 2023 | Agilent Technologies

FTIR Spectroscopy

Instrumentation

FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Environmental

Analysis of silicon, phosphorus and sulfur in 20% methanol using the Agilent 8800 Triple Quadrupole ICP-MS

Applications

| 2012 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

The Determination of Sodium, Calcium and Silicon in Pure Water by Graphite Furnace AA

Applications

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Environmental

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications

| 2020 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Determination of Boron by Graphite Furnace AAS: Comparison of Different Modifiers

Applications

| 2010 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Determination of K, Na, and Zn in Albumin Using Flame AAS

Applications

| 2015 | Agilent Technologies

AAS

Instrumentation

AAS

Manufacturer

Agilent Technologies

Industries

Clinical Research

Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ

Applications

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Applications from Agilent Technologies | LabRulez ICPMS

Optical Characteristics and Thickness of 2-layered Structures

The Determination of Metals in Chlorinated Hydrocarbons by Flame Atomic Absorption

Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

Analyzing Colored Microplastics with the Agilent 8700 Laser Direct Infrared (LDIR) Chemical Imaging System

Analysis of silicon, phosphorus and sulfur in 20% methanol using the Agilent 8800 Triple Quadrupole ICP-MS

The Determination of Sodium, Calcium and Silicon in Pure Water by Graphite Furnace AA

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Determination of Boron by Graphite Furnace AAS: Comparison of Different Modifiers

Determination of K, Na, and Zn in Albumin Using Flame AAS

Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ

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