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Applications focused on GD/MP/ICP-AES - page 1
Agilent MP Expert Software
Technical notes
| 2011 | Agilent Technologies
Software, GD/MP/ICP-AES
Instrumentation
Software, GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Agilent MP Expert Software
Technical notes
| 2016 | Agilent Technologies
Software, GD/MP/ICP-AES
Instrumentation
Software, GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Adjustment, Improvement, and Control of a Physical Vapor Deposition (PVD) Process Using Quantitative Depth Profile (QDP) Analysis
Applications
| 2021 | LECO
GD/MP/ICP-AES, Elemental Analysis, Optical Emission Spectroscopy (OES)
Instrumentation
GD/MP/ICP-AES, Elemental Analysis, Optical Emission Spectroscopy (OES)
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Shimadzu Analytical and Measuring Instrument
Brochures and specifications
| 2023 | Shimadzu
GC, GCxGC, GC/MSD, GC/MS/MS, HeadSpace, SPME, Thermal desorption, Sample Preparation, Pyrolysis, GC/SQ, GC/QQQ, Consumables, Software, MALDI, MS Imaging, HPLC, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC columns, LC/QQQ, DART, LC/SQ, PrepLC, RAMAN Spectroscopy, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, GD/MP/ICP-AES, X-ray, XRD, TOC
Instrumentation
GC, GCxGC, GC/MSD, GC/MS/MS, HeadSpace, SPME, Thermal desorption, Sample Preparation, Pyrolysis, GC/SQ, GC/QQQ, Consumables, Software, MALDI, MS Imaging, HPLC, LC/TOF, LC/HRMS, LC/MS, LC/MS/MS, LC columns, LC/QQQ, DART, LC/SQ, PrepLC, RAMAN Spectroscopy, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, GD/MP/ICP-AES, X-ray, XRD, TOC
Manufacturer
Shimadzu
Industries
Shimadzu Journal Vol 03 - Environmental Analysis
Others
| 2015 | Shimadzu
GC, GC/MSD, HeadSpace, GC/SQ, LC/MS, LC/MS/MS, LC/QQQ, ICP-OES, GD/MP/ICP-AES, TOC
Instrumentation
GC, GC/MSD, HeadSpace, GC/SQ, LC/MS, LC/MS/MS, LC/QQQ, ICP-OES, GD/MP/ICP-AES, TOC
Manufacturer
Shimadzu
Industries
Environmental
Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 Microwave Plasma-Atomic Emission Spectrometer
Applications
| 2016 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Materials Testing
Quantitative Depth Profile (QDP) Analysis of Aluminum Clad
Technical notes
| 2007 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
QDP Analysis of Galvanized Steel
Technical notes
| 2007 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
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