Quantitative Depth Profile (QDP) Analysis of Aluminized Steel
Applications
| 2009 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Quantitative Depth Profile (QDP) Analysis of Plated Samples
Technical notes
| 2006 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Understanding the Glow Discharge Source
Technical notes
| 2007 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Direct determination of Al, B, Co, Cr, Mo, Ti, V and Zr in HF acid-digested nickel alloy using the Agilent 4210 Microwave Plasma-Atomic Emission Spectrometer