Applications focused on GD/MP/ICP-AES - page 5

Simultaneous Analysis of Trace and Major Elements in Iron and Steel by ICPE-9820

Applications
| 2014 | Shimadzu
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Shimadzu
Industries
Materials Testing

New methodology for determination of gold and precious metals using the Agilent 4100 MP-AES

Applications
| 2011 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental

Analysis of Low Alloy, Cr-Mo, 12L14 and Hadfield Steels

Technical notes
| 2007 | LECO
GD/MP/ICP-AES, Elemental Analysis
Instrumentation
GD/MP/ICP-AES, Elemental Analysis
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals

Ultra-Trace Analysis of Metals in Mineral Reference Materials

Applications
| 2021 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental

Analysis of domestic sludge using the Agilent 4200 MP-AES

Applications
| 2015 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental

Microwave Plasma Atomic Emission Spectroscopy (MP-AES)

Guides
| 2021 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma

ASTM D8351-22: Elemental Analysis of Biodiesel using MP-AES

Applications
| 2022 | Agilent Technologies
GD/MP/ICP-AES
Instrumentation
GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Agilent MP Expert Software

Technical notes
| 2011 | Agilent Technologies
Software, GD/MP/ICP-AES
Instrumentation
Software, GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries

Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature

Applications
| 2026 | Shimadzu
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Instrumentation
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Manufacturer
Shimadzu
Industries
Semiconductor Analysis

Adjustment, Improvement, and Control of a Physical Vapor Deposition (PVD) Process Using Quantitative Depth Profile (QDP) Analysis

Applications
| 2021 | LECO
GD/MP/ICP-AES, Elemental Analysis, Optical Emission Spectroscopy (OES)
Instrumentation
GD/MP/ICP-AES, Elemental Analysis, Optical Emission Spectroscopy (OES)
Manufacturer
LECO
Industries
Materials Testing, Energy & Chemicals
Other projects
GCMS
LCMS
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