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Applications focused on ICP/MS/MS - page 12

Using ICP-MS/MS with M-Lens for the analysis of high silicon matrix samples

Posters
| 2020 | Agilent Technologies (ASMS)
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Agilent ICP-MS Journal (April 2017 – Issue 68)

Others
| 2017 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Measurement of traces of heavy metals in cosmetic raw materials and finished products according to ISO/DIS 21392:2021 using triple quadrupole ICP-MS

Applications
| 2025 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Other

GCC: Best practices for the analyses of complex samples by ICP-OES and ICP-MS: Streamline workflow for accurate results

Presentations
| 2022 | Thermo Fisher Scientific
Sample Preparation, ICP/MS, ICP-OES, ICP/MS/MS
Instrumentation
Sample Preparation, ICP/MS, ICP-OES, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals

Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of ultratrace elements in photoresist solvents using the Thermo Scientific iCAP TQs ICP-MS

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific, Elemental Scientific, Teledyne LABS
Industries
Semiconductor Analysis

Agilent Atomic Spectroscopy: AA, MP-AES, ICP-OES, ICP-MS, ICP-QQQ

Brochures and specifications
| 2021 | Agilent Technologies
ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES
Instrumentation
ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries

Determination of ultratrace elements in semiconductor grade nitric acid using the Thermo Scientific iCAP TQs ICP-MS

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Sulfur isotope fractionation analysis in mineral waters using an Agilent 8900 ICP-QQQ

Applications
| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Direct measurement of trace rare earth elements (REEs) in high-purity REE oxide using the Agilent 8800 Triple Quadrupole ICP-MS with MS/MS mode

Applications
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing
Other projects
GCMS
LCMS
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike