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Applications focused on AAS - page 7

The Analysis of Cement

Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals

Pb Analysis by Atomic Absorption

Applications
| N/A | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental

Cd analysis by Atomic Absorption

Applications
| N/A | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental

Ni Analysis by Atomic Absorption

Applications
| N/A | Shimadzu
AAS
Instrumentation
AAS
Manufacturer
Shimadzu
Industries
Environmental

Use of Drierite Trap to Extend the Lifetimeof Vapor Generation Absorption Cell

Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries

Flame Atomic Absorption Spectroscopy (Method Development ePrimer)

Guides
| 2021 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Environmental, Food & Agriculture, Energy & Chemicals

Shimadzu Analysis Guidebook Food Product Analyses

Guides
| 2014 | Shimadzu
GC, GCxGC, GC/MSD, GC/MS/MS, HeadSpace, GC/SQ, GC/QQQ, Consumables, HPLC, LC/MS, LC/MS/MS, LC columns, LC/QQQ, LC/SQ, UV–VIS spectrophotometry, ICP-OES, AAS, FTIR Spectroscopy
Instrumentation
GC, GCxGC, GC/MSD, GC/MS/MS, HeadSpace, GC/SQ, GC/QQQ, Consumables, HPLC, LC/MS, LC/MS/MS, LC columns, LC/QQQ, LC/SQ, UV–VIS spectrophotometry, ICP-OES, AAS, FTIR Spectroscopy
Manufacturer
Shimadzu
Industries
Food & Agriculture

Effective Data Management in the Analytical Laboratory

Posters
| 2016 | Shimadzu (Pittcon)
Software, HPLC, GC, UV–VIS spectrophotometry, FTIR Spectroscopy, AAS
Instrumentation
Software, HPLC, GC, UV–VIS spectrophotometry, FTIR Spectroscopy, AAS
Manufacturer
Shimadzu
Industries
Other

Selection of Operating Parameters for a New Boosted-Discharge Bismuth Lamp

Applications
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries

Linearity Limits for Several Trace Metals Currently Determined by Electrothermal Atomic Absorption Spectrometry

Technical notes
| 2010 | Agilent Technologies
AAS
Instrumentation
AAS
Manufacturer
Agilent Technologies
Industries
Other projects
GCMS
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LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike