Applications focused on ICP/MS | LabRulez ICPMS

Accurate analysis of neptunium 237 in a uranium matrix, using ICP-QQQ with MS/MS

Applications

| 2017 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Energy & Chemicals

Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS, Laser ablation

Instrumentation

ICP/MS, ICP/MS/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Agilent ICP-MS Journal (April 2018. Issue 72)

Others

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Food & Agriculture, Semiconductor Analysis

Agilent Atomic Spectroscopy Solutions for the Semiconductor Industry

Guides

| 2020 | Agilent Technologies

ICP/MS, ICP/OES, AAS, ICP/MS/MS, MP/ICP-AES

Instrumentation

ICP/MS, ICP/OES, AAS, ICP/MS/MS, MP/ICP-AES

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Instruments for Analyzing / Evaluating Electronic Device

Brochures and specifications

| 2022 | Shimadzu

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Instrumentation

GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP/OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC

Manufacturer

Shimadzu

Industries

Materials Testing, Semiconductor Analysis

Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions

Applications

| 2021 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Methods for the Forensic Analysis of Adhesive Tape Samples by LA-ICP- MS

Applications

| 2004 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Forensics

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications

| 2020 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of Ultratrace Impurities in High Silicon Matrix Samples by ICP-QQQ

Applications

| 2021 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Applications focused on ICP/MS | LabRulez ICPMS

Accurate analysis of neptunium 237 in a uranium matrix, using ICP-QQQ with MS/MS

Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS

Agilent ICP-MS Journal (April 2018. Issue 72)

Agilent Atomic Spectroscopy Solutions for the Semiconductor Industry

Instruments for Analyzing / Evaluating Electronic Device

Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions

Methods for the Forensic Analysis of Adhesive Tape Samples by LA-ICP- MS

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Analysis of Ultratrace Impurities in High Silicon Matrix Samples by ICP-QQQ

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