Applications focused on ICP/MS - page 1

Hyphenation of a high-speed laser ablation system to Quadrupole Inductively Coupled Plasma Mass Spectrometry (ICP-MS) for imaging applications

Posters
| 2023 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS, Laser ablation
Instrumentation
ICP/MS, ICP/MS/MS, Laser ablation
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Benefits of coupling a high-speed laser ablation system to Quadrupole Inductively Coupled Plasma Mass Spectrometry (ICP-MS)

Posters
| 2021 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS, Laser ablation
Instrumentation
ICP/MS, ICP/MS/MS, Laser ablation
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Analysis of Trace Metal Impurities in High Purity Hydrochloric Acid Using ICP-QQQ

Applications
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

WPC: Hyphenation of a high-speed laser ablation system to Quadrupole Inductively Coupled Plasma Mass Spectrometry (ICP-MS) for imaging applications

Posters
| 2024 | Thermo Fisher Scientific
Laser ablation, ICP/MS
Instrumentation
Laser ablation, ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Removal of hydride ion interferences (MH+ ) on Rare Earth Elements using the Agilent 8800 Triple Quadrupole ICP-MS

Applications
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS

Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of ultratrace elements in semiconductor grade TMAH developer

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Materials Testing

Resolution of 176 Yb and 176 Lu interferences on 176 Hf to enable accurate 176 Hf/177 Hf isotope ratio analysis using ICP-QQQ with MS/MS

Applications
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

High-Throughput Semiquantitative Screening of Ambient Air Samples by ORS-ICP-MS and Integrated Sample Introduction System (ISIS)

Applications
| 2007 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Determination of ultratrace elements on silicon wafer surfaces using the Thermo Scientific iCAP TQs ICP-MS

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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