Methods for the Forensic Analysis of Adhesive Tape Samples by LA-ICP- MS
Applications
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Forensics
Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS
Applications
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Analysis of Volatile Metalloid Species in Gas Samples using a Commercial Cryotrapping System (TDS-G-CIS GC) Coupled to ICP-MS with PH3 and SF6 as Example Compounds
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
WCPS: Investigation of Microplastic Size and Number Changes During Simulated UV-Degradation Using Single Particle ICP-MS/MS
Posters
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Materials Testing
Using triple quadrupole interference removal to improve data quality in laser ablation ICP-MS for geochemical applications
Applications
| 2018 | Thermo Fisher Scientific
Laser ablation, ICP/MS, ICP/MS/MS
Instrumentation
Laser ablation, ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific, Teledyne LABS
Industries
Environmental
Agilent ICP-MS Journal (February 2018. Issue 71)
Others
| 2018 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals
Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode
Applications
| 2014 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Ultra-Trace Analysis of Organophosphorus Chemical Warfare Agent Degradation Products by HPLC-ICP-MS