Applications focused on ICP/MS - page 1

Total Sample Evaporation of 1 ng SRM U350

Applications
| 2011 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals

Analysis of Volatile Metalloid Species in Gas Samples using a Commercial Cryotrapping System (TDS-G-CIS GC) Coupled to ICP-MS with PH3 and SF6 as Example Compounds

Applications
| 2002 | GERSTEL
GC, Thermal desorption, ICP/MS, Speciation analysis
Instrumentation
GC, Thermal desorption, ICP/MS, Speciation analysis
Manufacturer
Agilent Technologies, GERSTEL
Industries
Environmental, Food & Agriculture

New Design 1013 Ω Amplifiers for Measurement of Small Ion Beam Currents

Applications
| 2015 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Other

Uranium isotopic analysis for the nuclear industry

Applications
| 2019 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals

Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS

Applications
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Uranium Isotopic Analysis for the Nuclear Industry Using the Thermo Scientific NEPTUNE Plus MC-ICP-MS

Applications
| 2014 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Environmental

Ultratrace Tin Speciation with GC-ICP-MS using the Thermo Scientific GCI 100 Interface

Applications
| 2016 | Thermo Fisher Scientific
GC, ICP/MS, Speciation analysis
Instrumentation
GC, ICP/MS, Speciation analysis
Manufacturer
Thermo Fisher Scientific
Industries
Environmental

Measurement of 87Sr/86Sr Isotope Ratios in Rocks by ICP-QQQ in Mass-Shift Mode

Applications
| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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