Analysis of Volatile Metalloid Species in Gas Samples using a Commercial Cryotrapping System (TDS-G-CIS GC) Coupled to ICP-MS with PH3 and SF6 as Example Compounds
New Design 1013 Ω Amplifiers for Measurement of Small Ion Beam Currents
Applications
| 2015 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Other
Uranium isotopic analysis for the nuclear industry
Applications
| 2019 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals
Automated Surface Analysis of Metal Contaminants in Silicon Wafers by Online VPD-ICP-MS/MS
Applications
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Uranium Isotopic Analysis for the Nuclear Industry Using the Thermo Scientific NEPTUNE Plus MC-ICP-MS
Applications
| 2014 | Thermo Fisher Scientific
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Thermo Fisher Scientific
Industries
Environmental
Ultratrace Tin Speciation with GC-ICP-MS using the Thermo Scientific GCI 100 Interface
Applications
| 2016 | Thermo Fisher Scientific
GC, ICP/MS, Speciation analysis
Instrumentation
GC, ICP/MS, Speciation analysis
Manufacturer
Thermo Fisher Scientific
Industries
Environmental
Measurement of 87Sr/86Sr Isotope Ratios in Rocks by ICP-QQQ in Mass-Shift Mode
Applications
| 2020 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental
Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)
Applications
| 2001 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS